|author(s)||Christian Kröher, Lea Kristin Gerling and Klaus Schmid|
|title||Identifying the Intensity of Variability Changes in Software Product Line Evolution|
|publication type||Beitrag zu einer Tagung / Konferenz|
|booktitle||Proceedings of the 22nd International Systems and Software Product Line Conference (SPLC'18)|
|digital object identifier (doi)||DOI: 10.1145/3233027.3233032|
|note||Best Paper Award|
The evolution of a Software Product Line (SPL) typically affects a variety of artifact types. The intensity (the frequency and the amount) in which developers change variability information in these different types of artifacts is currently unknown. In this paper, we present a fine-grained approach for the variability-centric extraction and analysis of changes to code, build, and variability model artifacts introduced by commits. This approach complements existing work that is typically based on a feature-perspective and, thus, abstracts from this level of detail. Further, it provides a detailed understanding of the intensity of changes affecting variability information in these types of artifacts. We apply our approach to the Linux kernel revealing that changes to variability information occur infrequently and only affect small parts of the analyzed artifacts. Further, we outline how these results may improve certain analysis and verification tasks during SPL evolution.
|Files / documents||Paper|